Surface Analytical Techniques for Analysis of Coatings

Surface Analytical Techniques for Analysis of Coatings

Brad Kobe
Surface Science Western

Understanding and solving manufacturing issues associated with coatings often requires the use of multiple analytical techniques. A number of case studies will be discussed to illustrate how different techniques such as scanning electron microscopy (SEM), Fourier transform infrared spectroscopy (FTIR), X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) can be applied to defect analysis, to identify surface contaminants, and to elucidate the cause of adhesion failures. For each problem we will discuss the approach used, sample preparation needed, choice of technique(s) and the type of results produced.